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Multiframe Super-Resolution Employing a Spatially Weighted Total Variation Model | IEEE Journals & Magazine | IEEE Xplore

Multiframe Super-Resolution Employing a Spatially Weighted Total Variation Model

Publisher: IEEE

Abstract:

Total variation (TV) has been used as a popular and effective image prior model in regularization-based image processing fields, such as denoising, deblurring, super-reso...View more

Abstract:

Total variation (TV) has been used as a popular and effective image prior model in regularization-based image processing fields, such as denoising, deblurring, super-resolution (SR), and others, because of its ability to preserve edges. However, as the TV model favors a piecewise constant solution, the processing results in the flat regions of the image being poor, and it cannot automatically balance the processing strength between different spatial property regions in the image. In this paper, we propose a spatially weighted TV image SR algorithm, in which the spatial information distributed in different image regions is added to constrain the SR process. A newly proposed and effective spatial information indicator called difference curvature is used to identify the spatial property of each pixel, and a weighted parameter determined by the difference curvature information is added to constrain the regularization strength of the TV regularization at each pixel. Meanwhile, a majorization-minimization algorithm is used to optimize the proposed spatially weighted TV SR model. Finally, a significant amount of simulated and real data experimental results show that the proposed spatially weighted TV SR algorithm not only efficiently reduces the “artifacts” produced with a TV model in fat regions of the image, but also preserves the edge information, and the reconstruction results are less sensitive to the regularization parameters than the TV model, because of the consideration of the spatial information constraint.
Page(s): 379 - 392
Date of Publication: 01 August 2011

ISSN Information:

Publisher: IEEE

References

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