Abstract:
As a part of R&D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0/spl de...Show MoreMetadata
Abstract:
As a part of R&D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0/spl deg/ to 75/spl deg/. These detectors have strips with pitches of 50, 125 and 250 /spl mu/m on the ohmic side. We have obtained the incident angle dependence which agreed well with a Monte Carlo simulation. The resolution was found to be 11 /spl mu/m for normal incidence with a pitch of 50 /spl mu/m, and 29 /spl mu/m for incident angle of 75/spl deg/ with a pitch of 250 /spl mu/m.
Published in: 1996 IEEE Nuclear Science Symposium. Conference Record
Date of Conference: 02-09 November 1996
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-3534-1
Print ISSN: 1082-3654
