I. Introduction
In this document we describe the functionality of spring-loaded RF-probes for mass-production test applications. Wireless and high-speed data technologies are an ubiquitous part of our world. Companies all over the world are producing countless modules with RF techngology each day to meet the demands of the 21st century. Prior to dispatching the items to the vendors, those devices have to be tested with sophisticated measurement techniques in order to guarantee proper functionality (production-line tests). Imagine having to test an MMIC-5 GHz amplifier unit with 2 SMA-jacks. RF Engineers would probably take a VNA, the right cables and plugs. But what if not one unit has to be tested, but for example 5,000 each day?