I. Introduction
Single event effects and phenomena are a well-known problem for electronic systems operating in a radiation environment [1]. Pulses of ionizing radiation are known to be effective in corrupting the information integrated circuits store [2]– [4]. In the galactic cosmic ray environment typical of high altitude satellite orbits, a single event upset (SEU), which occurs when a charged particle passing through a cell deposits enough energy for the cell to change its state, should be taken into account.