I. Introduction
The whispering gallery mode (WGM) method has been used to make the most accurate measurements of the complex permittivity of extremely low-loss dielectric materials, both ceramic and crystalline. The method has been employed for very precise measurements of the permittivity and the dielectric losses of both isotropic and uniaxial anisotropic materials. [1]–[3] The WGM technique has also been used to characterize the complex permittivity of semiconductors, including bulk gallium arsenide (GaAs) and gallium phosphide (GaP) [4], at microwave frequencies from cryogenic temperatures to room temperature. In the paper, we present the measurement of a change of the permittivity [5] and the quality factor [6] resulting from polarization changes in the semiconductors GaAs and GaP under white light at cryogenic temperature.