An easy and accurate calibration procedure for 3-D shape measurement system based on phase-shifting projected fringe profilometry | IEEE Conference Publication | IEEE Xplore

An easy and accurate calibration procedure for 3-D shape measurement system based on phase-shifting projected fringe profilometry


Abstract:

An original procedure is presented for calibrating fringe projection-based 3D vision systems. The approach estimates both the phase-to-depth and transverse relationships ...Show More

Abstract:

An original procedure is presented for calibrating fringe projection-based 3D vision systems. The approach estimates both the phase-to-depth and transverse relationships by using the phase maps calculated for only three planes placed within the calibration volume. Experimental tests conducted on a fringe projection system show the effectiveness of the proposed procedure.
Date of Conference: 12-15 May 2008
Date Added to IEEE Xplore: 20 June 2008
ISBN Information:
Print ISSN: 1091-5281
Conference Location: Victoria, BC, Canada
References is not available for this document.

I. INTRODUCTION

In last decade optical 3-D shape measurement systems have been gaining an increasing importance in numerous fields of activities. In fact, we have witnessed their widespread from the first applications to reverse engineering problems requiring canonical surfaces to be reconstructed, to other areas as diverse as industrial, medical, space exploration and cultural heritage to name a few. The industry is today very attracted by the possibilities given by the inspection of products performed by the optical measurement systems [1]–[3], that capture shape data from surfaces in the form of a cloud of points. Traditional areas where they have been successful are the contact-less inspection of manufactured goods such as automobiles, semiconductor chips, food and pharmaceuticals, with the goal to reduce production costs due to manual labour or defective parts and ensure consistent product quality. Then optical 3-D shape measurement systems can automate manufacturing processes by controlling manufacturing equipment such as industrial robotic arms. They may also allow manufacturers to cut down the spending on defective goods since they are useful to check goods (silicon wafer, semiconductor chips or the surface of painted vehicles) for defects one by one with the aim to correct the parameters of the industrial process as soon as a defect is found. On the other hand the current tendency evolves towards the use of scanners in the reconstruction of human faces, sculptures, paintings, pre-historical footprints, and so on. The key to their success can be found in their distinctive attributes. In particular flexibility, reliability, higher operating speeds, consistency and objectivity have made them competitive with respect to traditional measurement systems.

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1.
A.M. Wallace, "Industrial applications of computer vision since 1982," IEEE Proceedings Computers and Digital Techniques, vol.135, no.3pp. 117-136, May 1988.
2.
Y. Sumi, M. Sallinen, M. Sirvio, J. Vainola, "Recognition of large work objects in difficult industrial environments," IEEE International Conference on Systems, Man and Cybernetics vol.6, no.pp. 5285-5289 vol.6, 2004.
3.
R. Anchini, G. Di Leo, C. Liguori, A. Paolillo "New Measurement Techniques for the on Line Dimension Characterization of Automotive Rubber Profiles", 18th IMEKO WORLD CONGRESS, Metrology for a Sustainable Development, Rio de Janeiro, Brazil, September, 2006
4.
Y. Surrel, "Design of algorithms for phase measurement by the use of phase stepping," Applied Optics 35, pp. 51-60, Jan. 1996.
5.
K. Creath, "Comparison of phase-measurement algorithms," Surface characterization and testing 680, pp. 19-28, 1986.
6.
G. Sansoni, S. Lazzari, M. Carocci, and F. Docchio, "Development and characterization of a 3D measuring system based on integration of gray code and phase-shift light projection" in Ellson and Nurre Dd , pp. 139-147.
7.
H. Liu, W. Su, K. Reichard, S. Yin, "Calibration based phase-shifting projected fringe profilometry for accurate absolute 3D surface profile measurement", Optics communications 216, pp. 65-80, 2003.
8.
G. Guidi, M. Pieraccini, S. Ciofi, V. Damato, J-A. Beraldin, C. Atzeni, "Tridimensional digitizing of Donatello's Maddalena", Proceedings of International Conference on Image Processing, Vol 1, pp. 578-581, 2001
9.
Z. Zhang, D. Zhang, X. Peng, "Performance analysis of a 3D full-field sensor based on fringe projection", Optics and Lasers in Engineering, Vol. 42 (3), pp. 341-353, 2004.
10.
R. Legarda-Saenz, T. Bothe, W. P. Juptner, "Accurate procedure for the calibration of a structured light system", Optical Engineering, Vol. 43 (2), pp. 464-471, February 2004.
11.
Tavares P. J., Vaz M. A. "Linear calibration procedure for the phase-to-height relationship in phase measurement profilometry", Optics Communications, Vol. 274 (2), pp. 307-314, 15 June 2007.
12.
Z. Zhang, "A flexible new technique for camera calibration", IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 22, Issue 11, Nov. 2000, pp. 1330-1334.
13.
J. Strand, T. Taxt, "Two-dimensional phase unwrapping using robust derivate estimation and adaptive integration", IEEE Trans. Image Processing, vol. 11, Ottobre 2002, pp.1192-1200.

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References

References is not available for this document.