Incorporating Design Research for Missile Testing in PXI Based on BIT and ATE

Progressively, built-in test (BIT) and automatic test equipment (ATE), synthesizing design and application, become the effective approach to improve complex system testability and maintainability. Widely, PXI (PCI extensions for Instrumentation) is applied to the domain of automated test. Analyzed on the configuration of resource, module design, system design, compatibility design, tolerated error design, and so on, this paper presented the method on the BIT and ATE. This paper researched the test-launch control system for launch missiles, incorporating design in PXI bus based BIT and ATE. It presented the system level test structure figure, the circuit level test structure figure and the flow chart of software. The application of technology promotes the intelligentizing; generalizing and miniaturizing of the test-launch control system for launch missiles so as to improve the whole performance of missiles.

1 Introduce

Since the 70's in last century, the combining of testing equipment and computer extended gradually, testing technique experienced from a quick change of GPIB, VME, VXI [1], [2], [3], [4], to the progress of intelligence, modularization, miniaturization and universal. In recent years, the PXI (PCI eXtensions For Instrumentation) technique based on PCI bus develops so quickly that it has abroad application in automatization testing realm [5], [6], [7]. This technique not only satisfies automatization testing instrument's developing needs, but also combines the PC technique's advantage, so it becomes interrelated realm's foreland and hotspot.