I. Introduction
This paper presents a new sensitivity calibration technique for Hall sensors [1]–[3]. Hall sensors are widely used to measure magnetic fields [4]. They can easily be integrated in conventional CMOS technologies without additional processing steps. However, they suffer from imperfections that limit their precision, and thus their use in high-performance measurement systems. In particular, the sensitivity drift due to temperature variations, mechanical stresses and ageing, is one of their current main limitations [5].