I. Introduction
Over the past five decades, avalanche photodiodes (APDs) have been utilized for a wide range of commercial, military, and research applications. In recent years, the primary driving force for research and development of APDs has been the optical communications. It is well known that the internal gain of APDs provides a higher sensitivity in optical receivers than PIN photodiodes [1]–[4], however, at the cost of more complex epitaxial wafer structures and bias circuits. The APDs have been successfully deployed in optical receivers that operate up to 10 Gb/s, and research on materials and device structures that will extend to higher bit rate applications is ongoing.