Abstract:
In flat panel display (FPD) fields, the defect rate of the final products yields the rate of particle deposition on FPD panels. Every best endeavor has been made to maint...Show MoreMetadata
Abstract:
In flat panel display (FPD) fields, the defect rate of the final products yields the rate of particle deposition on FPD panels. Every best endeavor has been made to maintain a clean fabrication environment. However, contamination by airborne particles is still significant. Moreover, contamination by particles near fast moving devices such as a lift or loader has been reported as being serious. Existing well-known treatments for contamination control never worked near fast moving devices. Thus, at this stage, devising a new contamination control strategy based on the analysis of particle flow behavior upon device movement is inevitable to increase FPD productivity. In this study, the particle flow behavior near a fast moving lift is analyzed based upon the results of two and three dimensional transient flow simulations. The simulation results show consistency, insisting that the proposed approach is proper and reliable. Based on our experience associated with FPD cleanrooms and equipment, a new contamination control strategy for the moving lift system in a FPD cleanroom is proposed
Published in: 2006 SICE-ICASE International Joint Conference
Date of Conference: 18-21 October 2006
Date Added to IEEE Xplore: 26 February 2007
ISBN Information:
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- IEEE Keywords
- Index Terms
- Flat Panel ,
- Contamination Control ,
- Particle Flow Behavior ,
- Simulation Results ,
- Interest Rate ,
- Particle Deposition ,
- Airborne Particles ,
- Clean Environment ,
- Transient Simulation ,
- Device Movement ,
- Vertical Direction ,
- Sidewall ,
- Velocity Profile ,
- Systematic Strategy ,
- Control Devices ,
- Mass Flow Rate ,
- Force Control ,
- Liquid Crystal Display ,
- Flow Circulation ,
- Perforated Plate ,
- Air Injection
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Flat Panel ,
- Contamination Control ,
- Particle Flow Behavior ,
- Simulation Results ,
- Interest Rate ,
- Particle Deposition ,
- Airborne Particles ,
- Clean Environment ,
- Transient Simulation ,
- Device Movement ,
- Vertical Direction ,
- Sidewall ,
- Velocity Profile ,
- Systematic Strategy ,
- Control Devices ,
- Mass Flow Rate ,
- Force Control ,
- Liquid Crystal Display ,
- Flow Circulation ,
- Perforated Plate ,
- Air Injection
- Author Keywords