IEEE Computer Society; TTTC: Test Technology Technical Council

Abstract:

Provides a listing of current committee members and society officers.

Provides a listing of current committee members and society officers.

Published in: 2006 IEEE International Test Conference

Date of Conference: 22-27 October 2006

Date Added to IEEE Xplore: 05 February 2007

ISBN Information:

DOI: 10.1109/TEST.2006.297776

Conference Location: Santa Clara, CA, USA