Abstract:
Most faults on transmission lines are single line to ground (SLG). For such faults single-phase reclosing would result in an improvement in transient stability over the a...Show MoreMetadata
Abstract:
Most faults on transmission lines are single line to ground (SLG). For such faults single-phase reclosing would result in an improvement in transient stability over the alternative of three-phase reclosing. The improvement is offset by the capacitive coupling from the other two energized conductors because it tends to sustain current in the original fault arc path, thereby lengthening the time required for arc deionization. An increase in dead time is therefore required which decreases the net improvement. This paper presents a novel method of nullifying the capacitive coupling effect. The method requires the addition of a capacitor, connected across the terminals of each breaker pole, proportional to the particular line being switched.
Published in: IEEE Transactions on Power Apparatus and Systems ( Volume: PAS-88, Issue: 4, April 1969)
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Elevated Temperature ,
- Transmission Line ,
- Types Of Defects ,
- Line Length ,
- Dead Time ,
- Capacitive Coupling ,
- Positive Sequence ,
- Technical Literature ,
- Circuit Breaker ,
- Hot Rolling ,
- Different Types Of Defects ,
- Stable Gain ,
- Transient Stability ,
- Creep Test ,
- Original Path ,
- Secondary Current ,
- Thermal Circuit ,
- Creep Curves ,
- Midpoint Of The Line ,
- Voltage Recovery ,
- Coupling Coefficient ,
- High Voltage ,
- Two-port Network ,
- University Of Wisconsin ,
- Digital Computer ,
- Wave Frequency ,
- Power Conditions ,
- Digital Program
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Elevated Temperature ,
- Transmission Line ,
- Types Of Defects ,
- Line Length ,
- Dead Time ,
- Capacitive Coupling ,
- Positive Sequence ,
- Technical Literature ,
- Circuit Breaker ,
- Hot Rolling ,
- Different Types Of Defects ,
- Stable Gain ,
- Transient Stability ,
- Creep Test ,
- Original Path ,
- Secondary Current ,
- Thermal Circuit ,
- Creep Curves ,
- Midpoint Of The Line ,
- Voltage Recovery ,
- Coupling Coefficient ,
- High Voltage ,
- Two-port Network ,
- University Of Wisconsin ,
- Digital Computer ,
- Wave Frequency ,
- Power Conditions ,
- Digital Program