Abstract:
We have explored two high-transition-temperature Josephson junction technologies for application in voltage standard arrays: step-edge junctions made with YBa/sub 2/Cu/su...Show MoreMetadata
Abstract:
We have explored two high-transition-temperature Josephson junction technologies for application in voltage standard arrays: step-edge junctions made with YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Au normal-metal bridges, and stacked series arrays of Josephson junctions in selectively doped, epitaxially grown Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/ heterostructures. For both kinds of junctions, Shapiro steps induced by a microwave bias were characterized as a function of power. We compare the technologies with respect to critical current and normal resistance uniformity, maximum achievable critical current, critical-current normal-resistance product, and operating temperature.<>
Published in: IEEE Transactions on Applied Superconductivity ( Volume: 5, Issue: 2, June 1995)
DOI: 10.1109/77.403202
National Institute for Standards and Technology, Boulder, CO, USA
National Institute for Standards and Technology, Boulder, CO, USA
National Institute for Standards and Technology, Boulder, CO, USA
Varian Associates, E. L. Ginzton Research Center, Palo Alto, CA, USA
Varian Associates, E. L. Ginzton Research Center, Palo Alto, CA, USA
Varian Associates, E. L. Ginzton Research Center, Palo Alto, CA, USA
National Institute for Standards and Technology, Boulder, CO, USA
National Institute for Standards and Technology, Boulder, CO, USA
National Institute for Standards and Technology, Boulder, CO, USA
Varian Associates, E. L. Ginzton Research Center, Palo Alto, CA, USA
Varian Associates, E. L. Ginzton Research Center, Palo Alto, CA, USA
Varian Associates, E. L. Ginzton Research Center, Palo Alto, CA, USA