Abstract:
Techniques are described which allow the traceable measurement, at low uncertainty levels, of changes in attenuation value in excess of 140 dB at frequencies from 0.5 MHz...Show MoreMetadata
Abstract:
Techniques are described which allow the traceable measurement, at low uncertainty levels, of changes in attenuation value in excess of 140 dB at frequencies from 0.5 MHz to 100 MHz. The coherent nature of the dual channel techniques employed allows the changes in the path length through an attenuator, produced when its setting is changed, to be measured accurately even at high attenuation levels.<>
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 44, Issue: 2, April 1995)
DOI: 10.1109/19.377838
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Attenuation Measurements ,
- Dual-channel ,
- Surplus Value ,
- Attenuation Values ,
- Attenuation Level ,
- Low Level Of Uncertainty ,
- Solid Line ,
- Dynamic Range ,
- Phase Change ,
- Phase Shift ,
- Reflection Coefficient ,
- Channel Signal ,
- Lock-in Amplifier ,
- Local Oscillator ,
- Reference Channel ,
- Voltage Ratio ,
- dB Steps ,
- dB Attenuation ,
- Uncertainty Contribution ,
- Theoretical Shift ,
- Leakage Path
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Attenuation Measurements ,
- Dual-channel ,
- Surplus Value ,
- Attenuation Values ,
- Attenuation Level ,
- Low Level Of Uncertainty ,
- Solid Line ,
- Dynamic Range ,
- Phase Change ,
- Phase Shift ,
- Reflection Coefficient ,
- Channel Signal ,
- Lock-in Amplifier ,
- Local Oscillator ,
- Reference Channel ,
- Voltage Ratio ,
- dB Steps ,
- dB Attenuation ,
- Uncertainty Contribution ,
- Theoretical Shift ,
- Leakage Path