Techniques for Measurement and Correction of the SNS Accumulator Ring Optics | IEEE Conference Publication | IEEE Xplore

Techniques for Measurement and Correction of the SNS Accumulator Ring Optics


Abstract:

The Spallation Neutron Source (SNS) Accumulator Ring will reach peak intensities of 1.5×1014protons/pulse through multi-turn charge-exchange injection. Accumulation of th...Show More

Abstract:

The Spallation Neutron Source (SNS) Accumulator Ring will reach peak intensities of 1.5×1014protons/pulse through multi-turn charge-exchange injection. Accumulation of these unprecedented beam intensities must be accomplished while maintaining extremely low losses (less than 1 W/m). It is anticipated that the understanding and control of the ring optics will be important for achieving these low loss rates. We describe our plans for measuring and correcting the optical functions of the accumulator ring lattice.
Date of Conference: 16-20 May 2005
Date Added to IEEE Xplore: 13 February 2006
Print ISBN:0-7803-8859-3

ISSN Information:

Conference Location: Knoxville, TN, USA
References is not available for this document.

INTRODUCTION

At full design intensity, the SNS accumulator ring will reach peak intensities of protons/pulse. The 1-msec long linac beam pulse is accumulated in the ring over 1060 turns via charge-exchange multi-turn injection using a stripping foil. In order to allow hands-on maintenance of beamline components, a stringent loss criterion of less than 1 W/m has been established. It is anticipated that good understanding and control of the ring optics will be important for achieving these low loss rates.

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1.
J. Wei et al., Proc. EPAC 2000, p. 978.
2.
D. Sagan, PRST-AB 3, 102801 (2000).
3.
J. Safranek, BNL note 63382 (1996).
4.
For a recent example see C. Steier et al., Proc. EPAC 2004, p. 1488.
5.
P. Cameron et al., Proc. PAC 2003, p. 2444.
6.
J. Holmes et al., Proc. EPAC 2004, p. 1530.
7.
ICFA Beam Dynamics Newsletter 30 (2003) 100.
8.
J.G. Wang et al., these proceedings.
9.
D. Raparia et al., Proc. EPAC 2004, p. 1574.

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References

References is not available for this document.