Ultrafast soft X-ray absorption spectroscopy

This paper demonstrates time resolved X-ray absorption spectroscopy with a resolution in the sub-20 fs range around the L-edge (100 eV) of amorphous silicon (XANES) and gathered information beyond the L-edge about the atomic structure with EXAFS. This setup can be easily adapted for other materials such as carbon, and open the way to gain insight into fast dynamical processes of large organic molecules.