I. Introduction
Silicones both as vapors and migration films greatly affect electrical contact performance in electromechanical devices. Silicone products are applied widely to various electronics because of their excellent characteristics. However, it has been reported that contact resistance of electromehanical devices with electrical contacts were degraded by the silicone which coats contacts surfaces in such a manner as migration, vapor transport, and direct coating [1] – [4]. Particularly, the silicone of low molecular weight evaporates from these silicone products and adsorbs easily on surfaces. Moreover residual low molecular weight silicone also evaporates gradually from silicone compounds such as a silicone rubber. In the presence of air, adsorbed silicone vapor decomposes to SiO2 under elevated temperature. As SiO2 is a typical insulator, if SiO2 interposed between contacts, the contact resistance increases and its reliability degrade. This degradation is called as silicone contamination [5] – [11]. The silicone contamination for electrical contacts is very important problems to be solved its mechanism and protections.