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Journals & Magazines >IEEE Transactions on Electron... >Volume: 39 Issue: 4

Analysis of current voltage characteristics of low-temperature-processed polysilicon thin-film transistors

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K. Ono; T. Aoyama; N. Konishi; K. Miyata
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Abstract:

The relationship between device performance and trap state density in polysilicon films was investigated. The density in the silicon energy gap was obtained by fitting th...Show More

Metadata

Abstract:

The relationship between device performance and trap state density in polysilicon films was investigated. The density in the silicon energy gap was obtained by fitting the calculated on-state current versus gate voltage curve to the measured one for low-temperature (>
Published in: IEEE Transactions on Electron Devices ( Volume: 39, Issue: 4, April 1992)
Page(s): 792 - 802
Date of Publication: 06 August 2002

ISSN Information:

DOI: 10.1109/16.127467
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