I. Introduction
Empirical tight-binding (ETB) has proven to be extremely useful for the simulation of optoelectronic devices, when details of the atomistic structure matter, but ab-initio approaches like DFT are not feasible. ETB has been used in the last decades in particular for studying random alloy and disorder effects in III-nitrides, like InGaN quantum-well structures, and for III-V based alloys [1], [2].