I. Introduction
As high-speed integrated circuits advance, the emergence of electromagnetic interference (EMI) has become a prominent concern limiting the performance of electronic devices. Near-field probes, recognized as effective tools for electromagnetic emission detection, are employed for the precise localization and analysis of EMI sources within integrated circuits [1], [2]. Another application involves using near-field probes to acquire near-field electric and magnetic field data from integrated circuits or boards, facilitating the establishment of radiation emission source models [3], [4], [5]. These models prove valuable for EMI prediction [6] and far-field estimation [7], [8].