Probe-Based Antenna Measurements at Sub-THz Frequencies

In this work, we integrate a probe platform and an over-the-air chamber to realize a probe-based antenna measurement system at sub-THz frequencies. Only one-time probing is needed to measure the S parameters and 3D radiation pattern. This probing operation is suitable for antenna-in-package modules where the feed point is at the opposite side of antenna. In addition, a sub-THz reflector is carefully designed for compact antenna test range so that the far field condition can be fulfilled in a small chamber.

I. Introduction

As wireless applications gain popularity, the demands of higher data rates become more significant. According to Shannon theorem, the data rates can be increased with a broader bandwidth. For this reason, the 5G wireless communication spectrum has expanded from FR1 (0.6~7 GHz) to FR2 (24~71 GHz). Higher frequency bands of B5G/6G have also been discussed [1], specifically the sub-THz frequency band (110~300 GHz). Although higher frequencies result in smaller component sizes and larger transmission bandwidth, issues like precise manufacturing and low-loss transition structures need to be solved at a low cost. To overcome these challenges, antenna-in-package (AiP) technology is utilized to reduce the path loss from the frontend module to the antenna.