I. Introduction
As the need for MOS transistor replacements in electronics has grown, the CNTFET has emerged as a strong contender thanks to its special abilities to deliver low OFF current characteristics, reduced power consumption, and improved performance [1]–[5]. Short channel effects on MOSFETs like Drain-Induced Barrier Lowering (DIBL), impact ionization, and surface scattering are becoming more prevalent as we approach the nanoscale [6] - [7]. The threshold voltage of CNTFETs is dependent on diameter, which gives them an additional benefit over MOSFETs. We can therefore obtain different thresholds by varying the diameter and chirality of CNTs.