I. Introduction
In recent years, the evolution of power electronics has placed increasingly higher demands on capacitor performance. In response, the film capacitor has emerged as a solution to meet the growing requirements for both enhanced power capabilities and reliability [1], [2]. One of the most distinctive attributes of metallized film capacitors (MFCs) is their self-healing (SH) capabilities, which enable them to endure multiple breakdown events under varying conditions [3]. This SH phenomenon is influenced by several factors, including operating voltage, mechanical pressure applied to the winding layer, and electrode thickness [4], [5], [6]. While the ability of capacitors to restore their insulation under high voltage is remarkable, it is important to note that the reliability of the capacitor may diminish significantly under high-frequency SH discharges caused by continuous over-voltage.