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Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 40, Issue: 2, April 1991)
First Page of the Article
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Cites in Papers - IEEE (13)
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1.
Rado Lapuh, Jan Kučera, Jakub Kováč, Boštjan Voljč, "Digital Multimeters Sampling Performance Comparison", 2024 Conference on Precision Electromagnetic Measurements (CPEM), pp.1-2, 2024.
2.
Ivan Lenicek, Damir Ilic, Roman Malaric, "Determination of High-Resolution Digital Voltmeter Input Parameters", IEEE Transactions on Instrumentation and Measurement, vol.57, no.8, pp.1685-1688, 2008.
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Ivan Lenicek, Damir Ilic, Roman Malaric, "Determination of digital voltmeter input parameters", 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, pp.1-4, 2007.
4.
R. Malaric, J. Butorac, I. Lenicek, "DVM input and leakage resistance analysis in the DVM-based resistance measurement systems", IEEE Transactions on Instrumentation and Measurement, vol.51, no.6, pp.1323-1327, 2002.
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G. Boella, P.P. Capra, C. Cassiago, R. Cerri, G.M. Reedtz, A. Sosso, "Traceability of the 10-k/spl Omega/ standard at IEN", IEEE Transactions on Instrumentation and Measurement, vol.50, no.2, pp.245-248, 2001.
6.
J.D. de Aguilar, R. Zorzano, M. Rodriguez, "Least-squares fitting of the current drift for a DVM-based comparison method", Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), pp.371-372, 2000.
7.
C. Rietveld, C.J. Van Mullem, "Uncertainty analysis of a DVM-based quantum Hall measurement set-up", Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), pp.90-91, 2000.
8.
J. Butorac, R. Malaric, I. Lenicek, "Establishment of resistance traceability chain for Croatian resistance standards", Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), pp.94-95, 2000.
9.
G. Boella, P. Capra, C. Cassiago, R. Cerri, G.M. Reedtz, A. Sosso, "Traceability of the 10 k/spl Omega/ standard at IEN", Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), pp.98-99, 2000.
10.
P. Svoboda, P. Chrobok, P. Vasek, "A simple DMM-based measuring system for QHE resistance measurements", Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031), pp.566-567, 2000.
11.
G. Rietveld, F.P. Jans, "A DVM-based accurate measurement setup for QHE resistance measurements", 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254), pp.416-417, 1998.
12.
B. Schumacher, "Automated quantum Hall-resistance standard", IEEE Transactions on Instrumentation and Measurement, vol.44, no.2, pp.199-200, 1995.
13.
R.L. Steiner, R.J. Astalos, "Improvements for automating voltage calibrations using a 10-V Josephson array", IEEE Transactions on Instrumentation and Measurement, vol.40, no.2, pp.321-325, 1991.
Cites in Papers - Other Publishers (5)
1.
Sang Hwa Lee, Kwang Min Yu, Jang Young Choi, Seok Myeong Jang, "Low-Uncertainty Equality Between the Voltage-Dividing and Resistance Ratio of a DC Resistive High Voltage Divider", Journal of Electrical Engineering & Technology, 2019.
2.
Kwang Min Yu, Wan Seop Kim, Sang Hwa Lee, Kwon Soo Han, Jeon Hong Kang, "A method for measuring high resistances with negligible leakage effect using one voltage source and one voltmeter", Measurement Science and Technology, vol.25, no.7, pp.075012, 2014.
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Helko E van den Brom, Ernest Houtzager, Gert Rietveld, Roland van Bemmelen, Oleg Chevtchenko, "Voltage linearity measurements using a binary Josephson system", Measurement Science and Technology, vol.18, no.11, pp.3316, 2007.
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G. Rietveld, "Accurate determination of the input impedance of digital voltmeters", IEE Proceedings - Science, Measurement and Technology, vol.151, no.5, pp.381-383, 2004.
5.
Roman Malarić, Ivan Leniček, Alan Šala, "Scaling of resistance standards in the Primary Electromagnetic Laboratory of Croatia", Measurement, vol.34, no.4, pp.347, 2003.
