I. Introduction
Accurate characterization of the relative permittivity of dielectric materials is crucial for a variety of applications, such as those involving wireless systems. This is even more crucial for higher-frequency applications due to the high level of integration of devices using, for example, an antenna-in-package [1]. In many cases, the materials are in solid form. However, for certain applications, such as those related to biomedical ones, it is required to characterize fluid materials [2].