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One Framework to Rule Them All? Framework for Testing Different Sampling Methods for Characterizing the EM Fields in a Scenario | IEEE Conference Publication | IEEE Xplore

One Framework to Rule Them All? Framework for Testing Different Sampling Methods for Characterizing the EM Fields in a Scenario


Abstract:

Since 2016, the implementation of EU product rules requires a mandatory risk assessment for all electronic products, as outlined in the European "Blue Guide." To comply w...Show More

Abstract:

Since 2016, the implementation of EU product rules requires a mandatory risk assessment for all electronic products, as outlined in the European "Blue Guide." To comply with the risk-based approach introduced by this guide, it is crucial to have a better understanding of the electromagnetic (EM) environment. However, existing methodologies for characterizing the EM environment have limitations. From it, an alternative methodology is briefly proposed to aid the risk assessment process by exploring the concept of spatial sampling EM fields. This paper will focus on efficiently implementing the concept by using a test framework. The latter part of the paper illustrates how the test framework is used to compare two sampling strategies in a low-complexity scenario.
Date of Conference: 04-08 September 2023
Date Added to IEEE Xplore: 10 October 2023
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Conference Location: Krakow, Poland

I. Introduction

The field of Electromagnetic Compatibility (EMC) has gained substantial importance in the past decade. One of the main reasons is the increased number of electronic devices introduced to society in the same period. These new devices have to perform harmoniously with old ones already deployed into the field, which only increases chances of Electromagnetic Interference (EMI). The answer from the engineering world was to introduce a new way of achieving EMC. Since 2016, A risk assessment has been added to the legal EMCD [1]–[3]. It is not possible to simply apply a set of rules, it is necessary to think in terms of scenario to ensure EMC through the life cycle of the product in its intended environment of use. To tackle this situation, [1]–[3] introduced a new risk-based approach that pushes manufacturers to acknowledge the risks for their devices through their life cycle.

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