I. Introduction
Amorphous oxide semiconductor (AOS) thin-film transistors (TFTs) have gained widespread attention in advanced displays and flexible integrated circuits (FICs) due to their exceptional performance, low power consumption, and simplified manufacturing processes [1], [2]. As the most representative AOS transistor, the Micro-scale amorphous indium-gallium-zinc (a-IGZO) TFT has been successfully applied to the mass production of large-area rigid displays. However, the increasing pixel-per-inch (PPI) of displays and growing integration density of FICs pose urgent demands on the downscaling of AOS TFTs. This is hindered by the parasitic short-channel effect [3], since the AOS channel is inherently populated with abundant native defects [4], thus demanding significantly strengthened gate controllability over such defective channel. Moreover, the AOS TFTs for flexible electronics further encounter the challenges of mechanical instabilities, plausibly also related to the diversified defect states in AOSs. The development of sub-Micron flexible AOS TFTs is highly expected to usher in the era of oxide-based flexible displays and electronics.