I. Introduction
Optical voltage sensors (OVS) based on Pockels electro-optic effect have the characteristics of compact size, good insulation performance and high measurement accuracy. Therefore, it is very suitable for smart grid requirements and its development prospect is very considerable [1]–[2]. However, due to the poor long-term stability, OVS is deployed only in non-critical applications for smart substations. Factors such as temperature, stress birefringence and aging are generally considered as the main reasons affecting the operational reliability of OVS, which seriously hinder its practical application and industrialization process.