An Adaptive Image Segmentation Network for Surface Defect Detection

Surface defect detection plays an essential role in industry, and it is challenging due to the following problems: 1) the similarity between defect and nondefect texture is very high, which eventually leads to recognition or classification errors and 2) the size of defects is tiny, which are much more difficult to be detected than larger ones. To address such problems, this article proposes an adaptive image segmentation network (AIS-Net) for pixelwise segmentation of surface defects. It consists of three main parts: multishuffle-block dilated convolution (MSDC), dual attention context guidance (DACG), and adaptive category prediction (ACP) modules, where MSDC is designed to merge the multiscale defect features for avoiding the loss of tiny defect feature caused by model depth, DACG is designed to capture more contextual information from the defect feature map for locating defect regions and obtaining clear segmentation boundaries, and ACP is used to make classification and regression for predicting defect categories. Experimental results show that the proposed AIS-Net is superior to the state-of-the-art approaches on four actual surface defect datasets (NEU-DET: 98.38% ± 0.03%, DAGM: 99.25% ± 0.02%, Magnetic-tile: 98.73% ± 0.13%, and MVTec: 99.72% ± 0.02%).

I. Introduction

In the manufacturing industry, the products often suffer from a lot of surface defects, such as scratches, cracks, and pores, which may reduce their strength and hurt their quality. Therefore, detection of surface defects has become one of the most crucial processes in industry. However, it is a pity that at present, many factories still perform manual inspections, which are time-consuming, subjective, low-efficiency, and low-accuracy. Thence, it is necessary to develop an automatic detection system of surface defects to improve their efficiency and reliability.