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Xuyao Jiang

Publications
2
Citations
0
Publications by Year
20242025
Co-Authors:
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Xuyao Jiang

Affiliation

College of Electric Power Engineering
Shanghai University of Electric Power
Shanghai, China

Publication Topics

Biography

Xuyao Jiang was born in Shanghai, China, in 1998. He received the B.S. and M.S. degrees in electrical engineering from the Shanghai University of Electric Power, Shanghai, China, in 2021 and 2024, respectively.,His research interests include condition monitoring of power electronics systems.(Based on document published on 23 September 2024).
Publications
2
Citations
0
Publications by Year
20242025
Co-Authors:
Show All Co-Authors (11)
Author's Published Works

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A Noncontact Open-Circuit Fault Detection Method for VSI Systems Using High-Frequency Common-Mode Switching Oscillations

Junhao Zhang;Hao Li;Dawei Xiang;Xuyao Jiang

IEEE Transactions on Transportation Electrification
Year: 2025 | Volume: 11, Issue: 1 | Journal Article |
Fault diagnosis is essential for enhancing the reliability of voltage source inverter (VSI) systems. This article proposes a rapid, noncontact method for detecting open-circuit faults (OCFs) in VSI systems. The high-frequency common-mode (HFCM) switching oscillation current is noninvasively captured as a novel indicator. The integrity of the HFCM oscillation signal is utilized to detect and locate...Show More

A Noncontact Open-Circuit Fault Detection Method for VSI Systems Using High-Frequency Common-Mode Switching Oscillations

Junhao Zhang;Hao Li;Dawei Xiang;Xuyao Jiang

Year: 2025 | Volume: 11, Issue: 1 | Journal Article |

An AHP-Based Defect Detection Algorithm Study for E-paper Pockmarks Detection

Quanjun Sun;Zucheng Huang;Hai Yuan;Weijun Wang;Jian Wang;Xuyao Jiang;Zheng Xu;Quanshuo Sun;Zhenjia Liu

2024 International Conference on Artificial Intelligence and Digital Technology (ICAIDT)
Year: 2024 | Conference Paper |
Pockmarks detection in electronic paper (e-paper) mannfactnring plays a crucial role since pockmarks defects compromise the clarity of the e-paper. Current vision-based pockmarks defect detection methods can only be applied to specific models of e-paper and particular types of pockmarks defects. They lack the ability to adjust detection accuracy in response to product models. Aiming at these issue...Show More

An AHP-Based Defect Detection Algorithm Study for E-paper Pockmarks Detection

Quanjun Sun;Zucheng Huang;Hai Yuan;Weijun Wang;Jian Wang;Xuyao Jiang;Zheng Xu;Quanshuo Sun;Zhenjia Liu

Year: 2024 | Conference Paper |

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