Author details
Author's Published Works
Scheduled Maintenance on Monday 1/13/2025
Single article sales and account management will be unavailable from 5:00 AM - 7:00 PM ET (09:00 - 23:00 UTC). We apologize for the inconvenience.
D. Kramer;M. Brugger;V. Klupak;C. Pignard;K. Roeed;G. Spiezia;L. Viererbl;T. Wijnands
G. Chlachidze;G. Ambrosio;M. Anerella;F. Borgnolutti;R. Bossert;S. Caspi;D. W. Cheng;D. Dietderich;H. Felice;P. Ferracin;A. Ghosh;A. Godeke;A. R. Hafalia;M. Marchevsky;D. Orris;P. K. Roy;G. L. Sabbi;T. Salmi;J. Schmalzle;C. Sylvester;M. Tartaglia;J. Tompkins;P. Wanderer;X. R. Wang;A. V. Zlobin
G. Chlachidze;G. Ambrosio;M. Anerella;F. Borgnolutti;R. Bossert;S. Caspi;D. W. Cheng;D. Dietderich;H. Felice;P. Ferracin;A. Ghosh;A. Godeke;A. R. Hafalia;M. Marchevsky;D. Orris;P. K. Roy;G. L. Sabbi;T. Salmi;J. Schmalzle;C. Sylvester;M. Tartaglia;J. Tompkins;P. Wanderer;X. R. Wang;A. V. Zlobin
A. V. Zlobin;N. Andreev;G. Apollinari;B. Auchmann;H. Bajas;E. Barzi;R. Bossert;G. Chlachidze;M. Karppinen;F. Nobrega;I. Novitski;L. Rossi;D. Smekens;D. Turrioni
Giorgio Vallone;Giorgio Ambrosio;Eric Anderssen;Nicolas Bourcey;Daniel W. Cheng;Paolo Ferracin;Philippe Grosclaude;Michael Guinchard;Susana Izquierdo Bermudez;Mariusz Juchno;Friedrich Lackner;Heng Pan;Juan Carlos Perez;Soren Prestemon;Michela Semeraro;Stephane Triquet
Giorgio Vallone;Giorgio Ambrosio;Eric Anderssen;Nicolas Bourcey;Daniel W. Cheng;Paolo Ferracin;Philippe Grosclaude;Michael Guinchard;Susana Izquierdo Bermudez;Mariusz Juchno;Friedrich Lackner;Heng Pan;Juan Carlos Perez;Soren Prestemon;Michela Semeraro;Stephane Triquet
Slawosz Uznanski;Ruben Garcia Alia;Markus Brugger;Chiara Cangialosi;Salvatore Danzeca;Benjamin Todd
Jaromir Ludwin;Mateusz Bednarek;Mikolaj Bednarski;Jaroslaw Bielewski;Pawel Bogdali;Giorgio D'Angelo;Witold Daniluk;Erazm Maria Dutkiewicz;Dominik Grzadziel;Grzegorz Janik;Piotr Jurkiewicz;Wieslaw Kantor;Andrzej Kotarba;Artur Krempa;Pawel Lasko;Waclaw Ostrowicz;Andrzej Proszkowiec;Felix Rodriguez Mateos;Andrzej Siemko;Magda Szeliga;Karol Witkowski;Damian Wojas
Jaromir Ludwin;Mateusz Bednarek;Mikolaj Bednarski;Jaroslaw Bielewski;Pawel Bogdali;Giorgio D'Angelo;Witold Daniluk;Erazm Maria Dutkiewicz;Dominik Grzadziel;Grzegorz Janik;Piotr Jurkiewicz;Wieslaw Kantor;Andrzej Kotarba;Artur Krempa;Pawel Lasko;Waclaw Ostrowicz;Andrzej Proszkowiec;Felix Rodriguez Mateos;Andrzej Siemko;Magda Szeliga;Karol Witkowski;Damian Wojas
Marco Buzio;Peter Galbraith;Juan Garcia Perez;Emanuele Laface;Stefano Pauletta
Gianluca Valentino;Ralph Assmann;Roderik Bruce;Stefano Redaelli;Nicholas Sammut
M. Buzio;L. Bottura;G. Brun;G. Fievez;P. Galbraith;J.G. Perez;R. Lopez;A. Masi;S. Russenschuck;N. Smirnov;A. Tikhov;L. Walckiers
Marinko Kovačić;Miguel Cerqueira Bastos;Michele Martino;Nikolai Beev;Daniel Valuch;Valerio Nappi;John R. Pickering
John R. Pickering;Nikolai Beev;Miguel Cerqueira Bastos;Daniel Valuch;Greg Hudson;Luis Palafox;Ralf Behr
M. Buzio;J. Beauquis;L. Bottura;M. Coccoli;G. Deferne;N. Krotov;E. Laface;A. Ruccio;J.G. Perez;D. Missiaen;P. Schnizer;N. Smirnov;E. Wildner;P. Winkes;L. Walckiers
Nico Giangiacomi;Gabriele Balbi;Alessia Damilano;Davide Falchieri;Alessandro Gabrielli;Luca Lama;Riccardo Travaglini
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
Test Whats new message.