Zheng Xu - IEEE Xplore Author Profile

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The operating lifetime of quantum-dot light-emitting diodes (QLEDs) is a critical parameter for quantum-dot display which is becoming an emerging display technology. To pinpoint the causes of device degradation, we demonstrated an enhanced reliability of all-solution processed QLEDs by introducing an insulating interfacial layer between the ETL and the QDs. It is confirmed that a PMMA interfacial ...Show More
Summary form only given. In this paper, the emission of organic material inserted between two amorphous silicon dioxides (a-SiO2 ) by using high-doped p-type silicon as anode or n-type silicon as cathode has been studied under AC and DC applied voltages. Enhanced charge carrier injection and luminance were observed, which shows high-doped silicon as electrodes can increase the quantity of injected...Show More