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Michael Szelong - IEEE Xplore Author Profile
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Michael Szelong

Publications
2
Citations
8
Publications by Year
20082020
Co-Authors:
Show All Co-Authors (8)
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Michael Szelong

Affiliation

Texas Instruments, Freising, Germany

Publication Topics

Biography

Michael Szelong received the M.Sc. (Dipl.Ing.) degree in electrical engineering and information technology at the Ruhr-University Bochum, Bochum, Germany, in 2011, and the Ph.D. degree from the Chair of Electronic Materials and Nanoelectronics, Ruhr-University Bochum, under the supervision of Dr. Ing. Ulrich Kunze, in 2017.,From 2008 to 2009, he spent ten months as a Research Assistant at Purdue University, West Lafayette, IN, USA, which has been fully funded by a scholarship of DAAD (German Academic Exchange Service). For his Ph.D. thesis, he developed electrical rectifiers on high-electron-mobility transistors (HEMTs) on GaAs/AlGaAs heterostructures, utilizing the analogy between 2-D quantized electron gases, optics, ballistics, and hydro...
Publications
2
Citations
8
Publications by Year
20082020
Co-Authors:
Show All Co-Authors (8)
Author's Published Works

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A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-bit Resolution

Umidjon Nurmetov;Tobias Fritz;Ernst Müllner;Christopher M. Dougherty;Michael Szelong;Franz Kreupl;Ralf Brederlow

IEEE Journal of Solid-State Circuits
Year: 2020 | Volume: 55, Issue: 4 | Journal Article |
Cited by: Papers (8)
Using an unmodified 130-nm CMOS process, we present the design of an integrated 2-D CMOS stress sensor and trim methodology resulting in 11-bit resolution and 66-dB dynamic range. The n-well-only primary sensing elements and p-type auxiliary elements allow post-calibrated measurement of both stress magnitude and angle over the commercial temperature range from 5 °C to 90 °C. The implementation is ...Show More

A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor With 11-bit Resolution

Umidjon Nurmetov;Tobias Fritz;Ernst Müllner;Christopher M. Dougherty;Michael Szelong;Franz Kreupl;Ralf Brederlow

Year: 2020 | Volume: 55, Issue: 4 | Journal Article |

Numerical investigation of different modes of arc attachment at tungsten cathodes in dependence on the electrode geometry

Frank H. Scharf;Michael Szelong;Juergen Mentel

2008 IEEE 35th International Conference on Plasma Science
Year: 2008 | Conference Paper |
Summary form only given. Diffuse and spot-like modes of arc attachment at thermionically emitting cathodes are observed in lamps and reproduced by numerical simulations. Examples of different modes on rod shaped electrodes made of pure tungsten were investigated by measurements in the Bochum model lamp being operated with argon at a pressure of p=0.26 MPa. The corresponding simulations are based o...Show More

Numerical investigation of different modes of arc attachment at tungsten cathodes in dependence on the electrode geometry

Frank H. Scharf;Michael Szelong;Juergen Mentel

Year: 2008 | Conference Paper |

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