Author details
Author's Published Works
Scheduled Maintenance on Monday 1/13/2025
Single article sales and account management will be unavailable from 5:00 AM - 7:00 PM ET (09:00 - 23:00 UTC). We apologize for the inconvenience.
Gijs A. G. M. Hendriks;Gert Weijers;Chuan Chen;Madeleine Hertel;Chi-Yin Lee;Peter M. Dueppenbecker;Marcus Radicke;Andy Milkowski;Hendrik H. G. Hansen;Chris L. de Korte
Hong-Bo Chen;Rui Zheng;Li-Yue Qian;Feng-Yu Liu;Sheng Song;Hong-Ye Zeng
Yue Zhang;Chengtao Peng;Qiuli Wang;Dan Song;Kaiyan Li;S. Kevin Zhou
Rashmi R. Deshpande;Ch. Renu Madhavi;Mahabaleswara Ram Bhatt
Shay Keren;Olivier Gheysens;Craig S. Levin;Sanjiv S. Gambhir
Annie M. Tang;Daniel F. Kacher;Edmund Y. Lam;Kelvin K. Wong;Ferenc A. Jolesz;Edward S. Yang
Rashmi R. Deshpande;Mahabaleswara Ram Bhatt;C. H. Renu Madhavi
M. Neumann;E. Breton;L. Cuvillon;L. Pan;C.H. Lorenz;M. de Mathelin
Georgios Pilikos;Chris L. de Korte;Tristan van Leeuwen;Felix Lucka
Jacopo Viti;Hendrik J. Vos;Nico de Jong;Francesco Guidi;Piero Tortoli
Yanis Mehdi Benane;Denis Bujoreanu;Roberto J. Lavarello;François Varray;Jean-Michel Escoffre;Anthony Novell;Christian Cachard;Olivier Basset
Tianli Wang;Yu Qiang;Weibao Qiu;Xinyu Zhang;Yuanyuan Shen;Minhua Lu;Xin Chen;Yanyan Yu
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
Test Whats new message.