Tadanori Tanahashi - IEEE Xplore Author Profile
Subscribe
ADVANCED SEARCH

Author details

< Back

Tadanori Tanahashi

Publications
11
Citations
101
Publications by Year
20162024
Co-Authors:
Show All Co-Authors (22)
Headshot silhouette indicating that no photo is available for this author

Tadanori Tanahashi

Affiliation

National Institute of Advanced Industrial Science and Technology (AIST), Koriyama, Japan

Publication Topics

Biography

Authors’ photographs and biographies not available at the time of publication.(Based on document published on 24 August 2017).
Publications
11
Citations
101
Publications by Year
20162024
Co-Authors:
Show All Co-Authors (22)
Author's Published Works

Showing 1-11 of 11 results

  • Sort

Filter Results

Show

Sort By

Results

AC Impedance Characteristics and Modeling of Electrical Leakage Circuit Within a Photovoltaic Module

Tadanori Tanahashi;Takashi Oozeki

2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC)
Year: 2024 | Conference Paper |
The electrical insulation resistance of photovoltaic (PV) modules plays an important role in maintaining the operational integrity of PV systems deployed in fields. This is because the breakdown of the electrical insulation of PV modules directly contributes to performance loss and electrical safety risks. To gain insight into the characteristics of the electrical leakage circuit between the PV ce...Show More

AC Impedance Characteristics and Modeling of Electrical Leakage Circuit Within a Photovoltaic Module

Tadanori Tanahashi;Takashi Oozeki

Year: 2024 | Conference Paper |

AC Impedance Characteristics and Modeling of Electrical Leakage Circuit Within a Photovoltaic Module Installed in a Field

Tadanori Tanahashi;Takashi Oozeki

IEEE Journal of Photovoltaics
Year: 2024 | Volume: 14, Issue: 3 | Journal Article |
The electrical insulation resistance of photovoltaic (PV) modules plays an important role in maintaining the operational integrity of PV systems deployed in fields. This is because the breakdown of the electrical insulation of PV modules directly contributes to performance loss and electrical safety risks. To gain insight into the characteristics of the electrical leakage circuit between the PV ce...Show More

AC Impedance Characteristics and Modeling of Electrical Leakage Circuit Within a Photovoltaic Module Installed in a Field

Tadanori Tanahashi;Takashi Oozeki

Year: 2024 | Volume: 14, Issue: 3 | Journal Article |

Corrosion under Front Electrodes of Crystalline Silicon Photovoltaic Cells Predominantly Contributes to Their Performance Degradation

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
Year: 2019 | Conference Paper |
Cited by: Papers (4)
To address the origin of the elevated series-resistance (Rs), which is a primary cause of corrosive degradation observed in field-aged photovoltaic (PV) modules, we evaluated the electrical characteristics of PV cells corroded with acetic acid vapor. The increase in Rs was detected at the interface between the front electrodes and the associated silicon wafer, where is identical to the location of...Show More

Corrosion under Front Electrodes of Crystalline Silicon Photovoltaic Cells Predominantly Contributes to Their Performance Degradation

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

Year: 2019 | Conference Paper |

Reproducing the “Framing” by a Sequential Stress Test

Tadanori Tanahashi;Keiichiro Sakurai;Tsuyoshi Shioda;William Gambogi;Nancy H. Phillips;Kaushik Roy Choudhury;Sergiu Spataru;David C. Miller;Michael Kempe;Michael Owen-Bellini;Peter Hacke

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
Year: 2019 | Conference Paper |
Cited by: Papers (2)
The "Framing" (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespective of the inclusion of UV-absorber in poly(ethylene-co-vinyl acetate) (EVA) encapsulant. UV-fluorescence imaging of the PV modules suggests that the spat...Show More

Reproducing the “Framing” by a Sequential Stress Test

Tadanori Tanahashi;Keiichiro Sakurai;Tsuyoshi Shioda;William Gambogi;Nancy H. Phillips;Kaushik Roy Choudhury;Sergiu Spataru;David C. Miller;Michael Kempe;Michael Owen-Bellini;Peter Hacke

Year: 2019 | Conference Paper |

Corrosion-Induced AC Impedance Elevation in Front Electrodes of Crystalline Silicon Photovoltaic Cells Within Field-Aged Photovoltaic Modules

Tadanori Tanahashi;Norihiko Sakamoton;Hajime Shibata;Atsushi Masuda

IEEE Journal of Photovoltaics
Year: 2019 | Volume: 9, Issue: 3 | Journal Article |
Cited by: Papers (10)
To identify the common degradation mechanism(s) between field-aged photovoltaic (PV) modules and PV cells/modules exposed to artificial corrosive stress, the ac impedance associated with the corrosion in the front electrodes was analyzed in the individual PV cells laminated within the PV modules, fielded for 21 years. By evaluating the ac impedance together with the PV performance for these PV cel...Show More

Corrosion-Induced AC Impedance Elevation in Front Electrodes of Crystalline Silicon Photovoltaic Cells Within Field-Aged Photovoltaic Modules

Tadanori Tanahashi;Norihiko Sakamoton;Hajime Shibata;Atsushi Masuda

Year: 2019 | Volume: 9, Issue: 3 | Journal Article |

Localization and Characterization of a Degraded Site in Crystalline Silicon Photovoltaic Cells Exposed to Acetic Acid Vapor

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

IEEE Journal of Photovoltaics
Year: 2018 | Volume: 8, Issue: 4 | Journal Article |
Cited by: Papers (19)
To examine the mechanisms of degradation owing to liberated organic acid from polymer materials in crystalline silicon (c-Si) photovoltaic (PV) modules, we attempt to characterize the degraded site in a PV cell exposed to acetic acid vapor by means of ac impedance spectroscopy. The location was electrically determined at the interface between the front electrodes and emitter of a silicon wafer. Co...Show More

Localization and Characterization of a Degraded Site in Crystalline Silicon Photovoltaic Cells Exposed to Acetic Acid Vapor

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

Year: 2018 | Volume: 8, Issue: 4 | Journal Article |

Cause of Current-Collection Failure Observed in $I_{\text{sc}}$ -Reduction Phase of PV Cells and Modules Exposed to Acetic Acid

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
Year: 2017 | Conference Paper |
The mechanism of current-collection failure resulting from corrosion of front electrodes is investigated by AC impedance measurement of PV cells and modules degraded by acetic acid. In addition to our previous findings which first incidence of power-loss (with fill factor reduction) is caused by the gap-formation underneath front electrodes, we suggest in this study that the following power-loss w...Show More

Cause of Current-Collection Failure Observed in $I_{\text{sc}}$ -Reduction Phase of PV Cells and Modules Exposed to Acetic Acid

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

Year: 2017 | Conference Paper |

Causes of Degradation Identified by the Extended Thermal Cycling Test on Commercially Available Crystalline Silicon Photovoltaic Modules

Shinji Kawai;Tadanori Tanahashi;Yutaka Fukumoto;Fujio Tamai;Atsushi Masuda;Michio Kondo

IEEE Journal of Photovoltaics
Year: 2017 | Volume: 7, Issue: 6 | Journal Article |
Cited by: Papers (33)
To assess the contribution of the thermomechanical stress on the long-term reliability of photovoltaic (PV) modules, we applied extended thermal cycling tests up to 600 cycles to 13 models of commercially available PV modules. The extensive testing, using 5-10 PV modules for each model, revealed that the levels of power loss, induced by thermal fatigue during this extended testing, differed in eac...Show More

Causes of Degradation Identified by the Extended Thermal Cycling Test on Commercially Available Crystalline Silicon Photovoltaic Modules

Shinji Kawai;Tadanori Tanahashi;Yutaka Fukumoto;Fujio Tamai;Atsushi Masuda;Michio Kondo

Year: 2017 | Volume: 7, Issue: 6 | Journal Article |

Electrical detection of gap formation underneath finger electrodes on c-Si PV cells exposed to acetic acid vapor under hygrothermal conditions

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Year: 2016 | Conference Paper |
Cited by: Papers (25)
For the current collection failure induced by the acidic corrosion in finger electrodes on photovoltaic (PV) cells, the formation and evolution of gaps underneath the electrodes were able to be found by the monitoring of AC impedance signals and I-V characteristics of PV cells. The similar degradation behavior was also observed in PV modules under damp heat test. Then, the degradation mechanisms o...Show More

Electrical detection of gap formation underneath finger electrodes on c-Si PV cells exposed to acetic acid vapor under hygrothermal conditions

Tadanori Tanahashi;Norihiko Sakamoto;Hajime Shibata;Atsushi Masuda

Year: 2016 | Conference Paper |

Direct evidence for pn junction without degradation in crystalline Si photovoltaic modules under hygrothermal stresses

Atsushi Masuda;Chizuko Yamamoto;Tadanori Tanahashi;Hitoshi Sai;Takuya Matsui

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Year: 2016 | Conference Paper |
Cited by: Papers (4)
Origin of degradation in output power for crystalline Si photovoltaic modules by hygrothermal stresses was studied. The direct evidence that pn junction is hardly damaged and the origin is damage in Ag finger electrodes was obtained through the experiments composed of removal of degraded finger electrodes and reconstruction of electrodes. It was suggested that electrode is final defense for reliab...Show More

Direct evidence for pn junction without degradation in crystalline Si photovoltaic modules under hygrothermal stresses

Atsushi Masuda;Chizuko Yamamoto;Tadanori Tanahashi;Hitoshi Sai;Takuya Matsui

Year: 2016 | Conference Paper |

IEEE Account

Purchase Details

Profile Information

Need Help?

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.