A Multiple Scattering Method for Efficient Analysis of Substrate-Integrated Waveguide Structures

A multiple scattering method is proposed for the analysis of substrate-integrated waveguide (SIW) structures in this letter. SIW structures are considered to be parallel plates embedded by the fence of metallic vias (labeled as SIW vias). The addition theorem of cylindrical waves is applied to the calculation of the multiple scattering among SIW vias and coaxial ports. The reflection matrix of SIW vias, which is derived by boundary conditions, can be connected to the radial scattering matrix obtained by the multiple scattering method. This leads to the network parameters in terms of coaxial ports of SIW structures on a plate pair. The accuracy and efficiency of the multiple scattering method are verified by numerical simulations in commercial full-wave solvers.

I. Introduction

Substrate-integrated waveguides (SIWs) have been proposed as novel waveguide structures, which are easy to fabricate and integrate with passive and active devices at low cost, and the advantages of conventional metallic rectangular waveguide such as high shielding and low losses are maintained as well [1]–[3]. Therefore, efficient analyses of SIW structure have become significant in the designing process of SIW devices.