Intrinsic Resitivity Nickel and Gold Thin Film Bolometers for Pulsed X-ray Measurements

Abstract:

Summary form only as given.

Summary form only as given.

Published in: IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297)

Date of Conference: 24-24 June 1999

Date Added to IEEE Xplore: 06 August 2002

Print ISBN:0-7803-5224-6

Print ISSN: 0730-9244

DOI: 10.1109/PLASMA.1999.829447

Conference Location: Monterey, CA, USA