I. Introduction
Single-pole multiple-throw switches are broadly utilized in modern communication systems requiring operation at 2G/3G/4G standards such as cell phones and tablets. This area has been dominated by solid-state switches such as Si-on-insulator (SOI), Si-on-sapphire (SOS), and GaAs switches due to their high-count SPNT switches (). SOI/SOS SPNT switches, while having excellent performance up to 2.7 GHz, quickly fail in terms of insertion loss and isolation above 3 GHz due to their inherent large off-state capacitance and low-pass tuning networks [1]–[5]. On the other hand, RF MEMS metal-contact switches have lower insertion loss and higher isolation and linearity in comparison to SOI/SOS switches.