I. Introduction
Due to deep-submicron manufacturing process variations every transistor in an Integrated Circuit (IC) has slightly different physical properties that lead to measurable differences in terms of its electronic properties like threshold voltage and gain factor. Since these process variations are uncontrollable during manufacturing, the physical properties of a device can neither be copied nor cloned. It is very hard, expensive and economically not viable to purposely create a device with a given electronic fingerprint. A Physically Unclonable Function (PUF) is an electronic circuit that measures the underlying fingerprint in the transistors that it is made of. Because of its dependency on the deep-submicron process variations, PUFs are very hard to reproduce by construction. However, in order to be able to use implementations of PUFs they should also be easy to challenge and their responses easy to measure.