I. Introduction
Dc-offset and low frequency noise elimination is an important design issue in integrated analog to digital converters (ADC). The requirements are especially stringent, if signals with small amplitudes and low frequencies have to be converted, as in the case of sensor read-out circuits. One of the main offset sources in ADCs is mismatch between the input differential pair transistors of operational amplifiers (opamp) or comparators. Different circuit techniques are used to reduce these opamp imperfections, such as chopping or correlated double sampling [1].