I. Introduction
With the advancements in space technology and semiconductor technology, the analysis of surface characteristics of materials has become increasingly crucial [1], [2]. Addressing this challenge, the photoelectron emission yield spectrum (PEYS) and energy spectrum (ES) testing methods have been employed. Traditionally, these tests utilized mercury lamps, deuterium lamps, or xenon lamps as light sources. However, as technology progresses, there is a growing demand among researchers for more precise test results, necessitating the use of continuously adjustable high-resolution ultraviolet monochromatic light as a light source, typically covering the range of 115–400 nm. Unfortunately, the efficiency of the currently available instruments providing ultraviolet monochromatic light is often suboptimal, significantly limiting testing efficiency and the signal-to-noise ratio. Therefore, designing a highly efficient photon collection module becomes a meaningful endeavor.