Showing 1-25 of 3,828 resultsfor "Index Terms":Extensive Testing
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This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an autom...Show More
State-of-Practice in GUI-based System and Acceptance Testing: An Industrial Multiple-Case Study
2013 39th Euromicro Conference on Software Engineering and Advanced Applications
Year: 2013 | Conference Paper |
Cited by: Papers (12)
Software testing is an essential means of evaluating software quality. System and acceptance tests aim to validate a system's conformance to its requirements on a high level of system abstraction. Therefore, they are generally performed by executing end-user scenarios through the system's graphical user interface (GUI). However, to the authors' best knowledge, there are no empirical studies that e...Show More
Toward Automatic Synthesis of SOC Test Platforms
2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
Year: 2007 | Conference Paper |
Cited by: Papers (5)
Employing a test platform in an SOC design to execute test procedures can greatly simplify many SOC test problems. It, however, would require tremendous human efforts if the test platform would be generated manually. In this paper, we describe a design automation system, called DASTEP (design automation system for SOC test platform), that is aimed to help users build a test platform and incorporat...Show More
Thermal Driven Test Access Routing in Hyper-interconnected Three-Dimensional System-on-Chip
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Year: 2009 | Conference Paper |
Cited by: Papers (13)
The rapid emergence of three dimensional integration using a ``Through-Silicon-Via'' (TSV) process calls for research activities on testing and design for testability. Compared to the traditional 2D designs, the 3D-SoC poses great challenges in testing, such as three dimensional placement of cores and test resources, severe chip overheating due to the nonuniform distribution of power density in 3D...Show More
An Extensive-Form Game Paradigm for Visual Field Testing via Deep Reinforcement Learning
Rui Ma;Yudong Tao;Mohamed M. Khodeiry;Xiangxiang Liu;Ximena Mendoza;Yuan Liu;Mei-Ling Shyu;Richard K. Lee
Glaucoma is the leading cause of irreversible but preventable blindness worldwide, and visual field testing is an important tool for its diagnosis and monitoring. Testing using standard visual field thresholding procedures is time-consuming, and prolonged test duration leads to patient fatigue and decreased test reliability. Different visual field testing algorithms have been developed to shorten ...Show More
Analog-to-Digital Converters (ADCs) are becoming increasingly common to be involved in most systems in Integrated Circuits (ICs). Thanks to the rapid growth of modern semiconductor technology, the performance of the data converters becomes better and better. One of the difficulties being faced is to be able to accurately and cost-effectively test the continually better performance ADCs. The conven...Show More
Innovative Converter Testing Technology and Overall Reliability and Availability Performance of HVDC Solutions
Julian Lange;Rolf Neubert;Bastian Alt;Volker Hussennether;Marcos Gimenes Christianini de Abreu
2021 AEIT HVDC International Conference (AEIT HVDC)
Year: 2021 | Conference Paper |
A highly experienced level of quality testing capabilities for HVDC converters is one of the key pre-requisites in guaranteeing operational reliability and availability of HVDC transmission schemes. In this paper we combine both aspects by introducing the testing capabilities of a newly installed Power Converter Test Center together with an overview of reliability and availability of HVDC projects...Show More
Common test-platform family for module, board, and sub-assembly level test
2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)
Year: 2000 | Conference Paper |
Cited by: Papers (2)
As defense industry procurement budgets continue to decrease and contractor consolidation increases, the demand for cost effective and timely product testing and efficient test facility utilization increases. To reduce the product test cost and cycle-time and test-facility space requirements, the Raytheon Missile Systems Test-Systems-Design-Center (TSDC) developed and implemented the Standard Test...Show More
TPS transportability: From the factory to the depot
Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s
Year: 1991 | Conference Paper |
Cited by: Patents (1)
A major issue in replacing testers is the need to transport test program sets (TPSs) from the installed tester to the replacement tester. A test program set includes test programs and fixtures. The authors first address some of the key issues involved in developing translation systems to transport TPSs from an installed depot tester to a replacement commercial tester. They then provide an example ...Show More
Feature-Based Testing by Using Model Synthesis, Test Generation and Parameterizable Test Prioritization
2018 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Year: 2018 | Conference Paper |
Cited by: Papers (6)
An approach for feature-based testing in efficient test processes, especially for use in agile development, is presented. Methods of model synthesis, model-based test generation, as well as coverage-based and requirement-based test prioritization are linked together in order to systematically and efficiently obtain prioritized test cases. The result is a reordered test suite promising quick feedba...Show More
An Review on Automated Test Data Generation with Java Environment
2024 First International Conference on Pioneering Developments in Computer Science & Digital Technologies (IC2SDT)
Year: 2024 | Conference Paper |
Software testing has long been regarded as a useful method for raising the caliber and dependability of software. Path testing is the principal technique for improving software quality and the most reliable software testing approach overall. In a realm of software testing, the demand for efficient and comprehensive automated test data generation techniques is ever-increasing. Addressing this need,...Show More
Poster: ClearTH Test Automation Framework: A Running Example of a DLT-Based Post-Trade System
Vladimir Panarin;Alyona Bulda;Iosif Itkin;Alexey Zverev;Kirill Zagorouiko;Murad Mamedov;Alyona Rybakova;Anna Gromova;Elena Treshcheva;Sergey Tishin;Rostislav Yavorskiy
2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)
Year: 2019 | Conference Paper |
Cited by: Papers (1)
The paper presents an overview of a test automation framework aimed at end-to-end functional and non-functional testing of DLT-based hybrid financial software for post-trade. The proposed solution comprises the components designed for testing user-facing parts of the SUT as well as business logic specific for different DLT-based architectures. This combined approach is seen as a viable solution of...Show More
This paper discusses our experience with the advantages of having SLT in an industrial test flow. In addition, the level of correlation of SLT failures to parameters from other testing steps is also studied for an in-production IC in this work to evaluate if the system-level failures of an IC can be identified at other testing steps. Note that the correlation study performed in this paper is not i...Show More
The Maturation of Search-Based Software Testing: Successes and Challenges
2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing (SBST)
Year: 2019 | Conference Paper |
Cited by: Papers (7)
In this paper we revisit the field of search-based software testing (SBST) in the context of its technological maturity. We highlight some successes with respect to tools, hybrid approaches, extensions and industry adoption. We then discuss some open challenges that remain for SBST including the need for new approaches to system testing, automated oracle generation, incorporating humans into the s...Show More
GABIST: A New Methodology to Find near Optimal LFSR for BIST Structure
2007 14th IEEE International Conference on Electronics, Circuits and Systems
Year: 2007 | Conference Paper |
Cited by: Papers (2)
Fault coverage and test time have important roles in using built in self-test (BIST). Two parameters are crucial and effective in BIST design: LFSR's polynomial (or configuration) and its initial seed. In this paper we propose a practical method for finding near optimal LFSR with genetic algorithm (GA) and show that LFSR is a good TPG compared with other TPGs. In this method, the candidate seeds a...Show More
Automated testing for large-scale critical software systems
2014 IEEE 5th International Conference on Software Engineering and Service Science
Year: 2014 | Conference Paper |
Cited by: Papers (1)
Software systems are important components for the deployment and operation of large-scale critical systems, such as nuclear plants and aerospace shuttles. The very high reliability is critically required. Due to the very large scale and computational complexity, however, there are some inherent challenges for conducting extensive testing. In this paper, we define such challenges in the testing sco...Show More
Speeding up Mutation Testing via Regression Test Selection: An Extensive Study
2018 IEEE 11th International Conference on Software Testing, Verification and Validation (ICST)
Year: 2018 | Conference Paper |
Cited by: Papers (22)
Mutation testing is one of the most powerful methodologies to evaluate the quality of test suites, and has also been demonstrated to be effective for various other testing and debugging problems, e.g., test generation, fault localization, and program repair. However, despite various mutation testing optimization techniques, mutation testing is still notoriously time-consuming. Regression Testing S...Show More
Generating Unit Tests for Documentation
Mathieu Nassif;Alexa Hernandez;Ashvitha Sridharan;Martin P. Robillard
Software projects capture redundant information in various kinds of artifacts, as specifications from the source code are also tested and documented. Such redundancy provides an opportunity to reduce development effort by supporting the joint generation of different types of artifacts. We introduce a tool-supported technique, called DScribe, that allows developers to combine unit test and document...Show More
Mutation Testing for Aspect-Oriented Programs
2008 1st International Conference on Software Testing, Verification, and Validation
Year: 2008 | Conference Paper |
Cited by: Papers (45)
Mutation testing has been shown to be one of the strongest testing criteria for the evaluation of both programs and test suites. Comprehensive sets of mutants require strong test sets to achieve acceptable testing coverage. Moreover, mutation operators are valuable for the evaluation of other testing approaches. Although its importance has been highlighted for aspect-oriented (AO) programs, there ...Show More
IEEE Standard for the Electronic Reporting of Distribution Transformer Test Data - Redline
IEEE Std C57.12.37-2015 (Revision of IEEE Std C57.12.37-2006) - Redline
Year: 2015 | Standard |
A basis for the electronic reporting of transformer test data on liquid immersed distribution transformers, as defined in the IEEE C57.12.2X, C57.12.3X, and C57.12.4X standards series, is provided in this standard. The specific set of test data to be reported, and the report format, is detailed along with an extended set of data as an option for the user.Show More
Extending UML testing profile towards non-functional test modeling
Federico Toledo Rodríguez;Francesca Lonetti;Antonia Bertolino;Macario Polo Usaola;Beatriz Pérez Lamancha
2014 2nd International Conference on Model-Driven Engineering and Software Development (MODELSWARD)
Year: 2014 | Conference Paper |
The research community has broadly recognized the importance of the validation of non-functional properties including performance and dependability requirements. However, the results of a systematic survey we carried out evidenced the lack of a standard notation for designing non-functional test cases. For some time, the greatest attention of Model-Based Testing (MBT) research has focused on funct...Show More
An Integrated Environment for Design Verification of ATE Systems
Hamidreza Hashempour;Fabrizio Lombardi;Warren Necoechea;Rakesh Mehta;Tim Alton
This paper deals with the verification of automatic test equipment (ATE) that is widely used for manufacturing testing of integrated circuits (ICs). Due to design complexity, manufacturers are facing substantial difficulties in verifying ATEs. Design flow and time execution of the verification process are severely limited when developing new hardware and software architectures for ATEs. We present...Show More
Compatibility and interoperability evaluation for all-digital protection system through automatic application test
2006 IEEE Power Engineering Society General Meeting
Year: 2006 | Conference Paper |
This paper proposes a methodology of compatibility and interoperability evaluation for all-digital protection system through automatic application testing. The paper starts with the introducing of compatibility and interoperability evaluation issues, explaining the importance of application tests. The paper then defines the performance indices and compatibility indices as well as the evaluation me...Show More
Hardware Test subjects in academic education
2022 Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (XV Technologies Applied to Electronics Teaching Conference)
Year: 2022 | Conference Paper |
Cited by: Papers (1)
No electronic product can be manufactured without an underlying test strategy, as this operation can assume 90 % of the overall cost of the product. This paper explores the need for testing in the context of electronic hardware development and production, and how its absence from normal university curriculums is affecting its presence during the design of industry-developed hardware. Testing strat...Show More
On the Effect of Object Redundancy Elimination in Randomly Testing Collection Classes
Pablo Ponzio;Valeria Bengolea;Simón Gutiérrez Brida;Gastón Scilingo;Nazareno Aguirre;Marcelo Frias
2018 IEEE/ACM 11th International Workshop on Search-Based Software Testing (SBST)
Year: 2018 | Conference Paper |
In this paper, we analyze the effect of reducing object redundancy in random testing, by comparing the Randoop random testing tool with a version of the tool that disregards tests that only produce objects that have been previously generated by other tests. As a side effect, this variant also identifies methods in the software under test that never participate in state changes, and uses these more...Show More
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