Evaluation and analysis of domestic ATE based on IC testing application

Evaluation of domestic automatic test equipment (ATE) is one of the most important tasks in promoting domestic substitution after domestic ATE has been manufactured. Firstly, an Evaluation method of domestic ATE based on IC testing application is introduced in this paper, including Specification and indicators comparison between domestic and international ATE of the same type, measurement of key indicators of domestic ATE, and at least 2 chips' test solution development and mass production application. And TBSTest T800 is chosen to compare the main indicators with Teradyne J750HD and Advantest V93K. Trough testing and verifying a high-performance processor chip and an optical fingerprint chip, TBSTest T800 is systematically analyzed and evaluated in terms of multiple dimensions, including software environment, hardware configuration, function, performance, test deviation, test yield, test efficiency, etc. Two chips are tested on T800 and international ATE respectively, the verification results are passed, and the following are the Judgment criteria for the testing accuracy, stability, and repeatability: CPK>1.67, yield difference: <0.5%, bin2bin difference: <1%, and test time difference: <10%. Over 10 million of these two chips have been tested, which fully proves the availability and the applicability of T800 in the development of test solutions and mass production test. The results have been recognized by users.