All-Pass NGD FIR Original Study for Sensor Failure Detection Application

This article deals with original design, implementation, test, and potential application of finite impulse response (FIR) with uncommon all-pass negative group delay (AP-NGD) circuit. The counterintuitive AP-NGD numerical circuit theory is established. The design method of first-order AP-NGD circuit is introduced with respect to the specified time-advance. The first-order difference equation was synthesized, designed, and implemented in STM32 Microcontroller Unit, and experimented to validate the AP-NGD characteristics. The AP-NGD FIR prototype was tested in the time-domain with Gaussian and arbitrary waveform sensored signals. Calculated and experimented results in very good agreement with the most significant time-advance −10 s ever experimented before are obtained. The potential industrial application of the NGD predictor for sensor fault diagnosis in real-time is described.