A 2x-Thru Standard De-embedding Method of Surface Components in High-Speed PCBs

This paper proposes a 2x-thru standard deembedding method for surface components in high-speed PCBs. This method uses one single symmetric fixture to de-embed device under tests (DUT) by extracting from the 2x-thru deembedding model in time domain channel characteristic analysis (TCC). The feasibility and accuracy of the method are verified using data obtained from simulated models with HFSS, and the de-embedding process is achieved with Matlab. The proposed method is compared with conventional Thru-reflect-line (TRL) method, and high precision has been proved. It requires far less standard fixtures and is much easier to implement. The proposed 2x-thru standard de-embedding method can be applied in high-speed circuits and on-chip components.