An Approch to Detect Low and High Dielectric Targets Behind the Wall with Through-Wall Imaging System

Nowadays, in through-wall imaging, the simultaneous detection of the dielectric contrast materials like wood and metal placed together behind the wall is quite a challenging task due to the strong reflections. This adds on to the limitation when targets are placed in complex environment like window that also gives the false target information. In this paper, a methodology for the detection of low and high dielectric target is developed and explored. The experimental data is collected in the through-wall imaging scenario for the contrast dielectric targets detection with window effect on the other side of the wall. Further, optimum rank thresholding is applied using the opt-shrink algorithm with the exploitation of noise subspace in singular value decomposition (SVD) for the detection of low dielectric material. A suitable agreement with the results of targets detection is obtained as per the scenario in complex environment with the proposed methodology.