X-ray resonant reflectometry as a multifunctional synchrotron method for studying magnetic nanofilms

X-ray resonant magnetic reflectometry is a synchrotron based non-destructive method of investigation of electronic and magnetic depth profiles in nanoscale multilayers. The choice of x-ray photon energy close to the absorption edges makes the method selective to oxidation state, crystallographic environment and magnetization of individual chemical elements. The enhanced technique dealing with acquisition and modelling of the angle-energy maps of resonant reflectance is discussed in the present contribution.