Multiphoton Microscopy of Ag/por-Si Composite

The photoluminescence of a composite based on porous silicon and silver was investigated by means of multiphoton microscopy. Also, scanning was carried out along the depth of the sample in the mode of multiphoton microscopy (for a depth of 138 μm). It was revealed that luminescence is occurred on the surface of the sample and at a certain distance at depth (luminescence zones); between these zones there are depth regions at which no luminescence is observed. It was also shown that the surface morphology, together with the nature of the luminescence, changes during the transition from the porous layer to the transition region of electrochemical anodization.