Pulsed X-ray irradiation response in the linear voltage regulator LM7805: before and after TID accumulation

Linear voltage regulators LM7805 are firstly irradiated in a Co-60 unit and subsequently irradiated in a pulsed X-ray radiation environment. The differences of the pulsed-irradiation response before and after total ionizing dose (TID) accumulation are observed and analyzed. The results indicate that the recovery time of the output voltage in the devices accumulating TID is longer than in those pristine ones. The TID effect and pulsed-irradiation response are discussed based on the circuitry of LM7805, and the influence of TID on the pulsed-irradiation response is analyzed via the analysis of the current gain of the integrated bipolar junction transistors (BJTs). The susceptive path for the TID affecting the pulsed-irradiation response in the device is figured out. Finally, simulation is carried out, and the results conform to the experimental results.