Multi-scale Correlated Analysis with Material Surface Treatment for Multipactor Suppression of Space Microwave Devices

Multipactor suppression of space microwave devices is of vitual significance for RF systems operated in vacuum environment, which can prevent the deterioration of device performance. This research presents one multi-scale correlated method of multipactor analysis, which involves the atomic scale of material, the micro morphology scale of device surface and the device scale, is proposed for multipactor suppression and performance improvement of microwave devices. The method is further applied to graphene covered nickel surface in specific device structure and is finally verified by comparing the results of correlated analysis with the experimental measurements, which indicates a promising prospect in space application.